The X-ray facility contains five separate x-ray diffractometers, each suited for a different characterization technique, they include:
 
 

Laue-Used to determine crystal orientation of materials. 

 
 

Lang-Ideal for imaging the topography of a material. 

 
 
 

Four Circle-Used to study internal stress of a crystal

 
 

Thin Film-Used to study thin film structures.

 

Powder diffractometer-Used to study powders